Test Handler
Advantage:
Designed for formed strip products or singulated loose components, the Sub-Turret Charging & Testing Equipment performs visual inspection, electrical testing, and final packaging. By utilizing a standard turret platform combined with a mature discrete component test system, it meets diverse customer requirements for testing chip tantalum capacitors.
PRODUCT DESCRIPTION
Features
As a high-precision semiconductor test handler, it integrates automatic feeding, charging, leakage current testing, ESR testing, capacitance testing, visual inspection, sorting, and final output in one stable production platform. The system helps manufacturers improve test consistency, reduce manual handling risks, and ensure reliable quality control before components enter downstream assembly or shipment.
This semiconductor test handler supports adjustable charging time, high UPH performance, polarity inspection, short-circuit alarm protection, and multiple output methods such as taping, tray, and bin box sorting. It can be integrated into existing automated test lines or customized for specific semiconductor final test requirements, helping customers build a more efficient and traceable testing process.
Tested Components: Chip Solid Tantalum Capacitors, Chip Conductive Polymer Tantalum Capacitors, Stacked Aluminum Capacitors.
Modular Design: High-precision modular design combined with imported Direct Drive (DD) motors ensures stability and high UPH output.
Visual Inspection: Equipped with a vision system to prevent material mixing and verify component polarity.
Test Fixture: Features physical isolation and short-circuit alarm design. This prevents measurement instability caused by conductive dust resulting from component rupture or explosion.
Auto-Clearance Function (Poka-yoke): Automatically clears materials from the machine during model changeovers to prevent mixing.
Electrical Testing: Real-time monitoring of current and voltage throughout the charging process. Utilizes standard instruments within a mature electrical test framework for stability and reliability.
Specifications
Operating Parameters
Test Items: High Voltage Charging - Leakage Current (DCL) Test + Low Voltage Charging - Leakage Current (DCL) Test.
Applicable Products: Chip Tantalum Capacitors (Case A, B, C, D, E, etc.).
Output Methods: Taping / Tray / Bin Box Sorting.
Charging Time: 1s ~ 40s (Adjustable).
Equipment UPH: 10K ~ 12K (Calculated based on 20s charging time).
Expandable Functions: Labeling Module / 4-Side Visual Inspection Module / Surge Current Test.
Measurement Specifications
DC Leakage Current (DCL)
Range: 0 ~ 2mA
Accuracy: ≤ ±(1% + 0.05µA) [Instrument: Tonghui TH2689]
Range: 0 ~ 2mA
Accuracy: ≤ ±(1% + 0.01µA) [Instrument: Keithley 6485]
ESR (Equivalent Series Resistance)
Range: 0.01Ω ~ 1Ω | Accuracy: ≤ ±1.5mΩ
Range: 1Ω ~ 9.99Ω | Accuracy: ≤ ±5mΩ
Capacitance
Range: 0.01µF ~ 999.99µF
Accuracy: ≤ ±1%
Dissipation Factor (Tan δ)
Range: 0 ~ 99.99%
Accuracy: ≤ ±0.2%
Measurement Specifications
Residual Voltage: ≤ 0.2V
False Rejection Rate: ≤ 0.8%
Missed Detection Rate: 0
Power Supply: 3-Phase 380V
Operating Environment: 23℃ ~ 27℃
Compressed Air: 0.5 MPa ± 0.1 MPa
Contact Us
Guangzhou Top-leading Intelligent Technology Co.,Ltd
Contact Us
Guangzhou Top-leading Intelligent Technology Co.,Ltd
