Ceramic Automated Optical Inspection System — Professional Technical Overview
The Ceramic Automated Optical Inspection (AOI) System is an advanced machine-vision based inspection platform engineered for high-performance quality control in semiconductor manufacturing and related high-reliability industries. It combines precision mechanical design, specialized optical imaging, and intelligent detection software to automate defect detection on ceramic-based substrates and related materials.
1. System Purpose and Application Scope
This AOI system is designed to address the need for high-accuracy, non-contact visual quality inspection in production environments where ceramic materials are used as structural carriers or circuit substrates.
Typical application fields include:
· Semiconductor manufacturing
· New energy (advanced packaging, power modules)
· High-reliability electronic ceramics and passive component substrates
It is particularly suited for inspection of key ceramic and hybrid materials such as:
· Green ceramic tapes
· Thin-film circuit layouts
· Thick-film ceramic substrates
· Resistor substrate derivatives and similar ceramic products
2. Core Technical Capabilities
Patented Optical Inspection Technology
The system uses a patented optical design tailored for multi-material inspection, enabling reliable imaging across a range of surfaces including ceramics, metals, and polymers. This optical subsystem captures high-resolution images that reveal critical surface conditions and defects.
Precision Mechanical Platform
A custom-engineered marble precision platform with ±1 µm accuracy and linear servo motor motion control provides stable, repeatable positioning for inspection routines. This mechanical foundation supports high repeatability required for industrial inline quality inspection.
Smart Detection Software
The integrated software combines:
· DXF one-click programming for rapidly importing CAD inspection templates
· AI-enhanced detection logic alongside traditional rule-based analysis
· Automatic defect characterization and reporting
This dual-mode detection improves accuracy and reduces false calls, enabling robust defect classification and actionable outputs.
Upstream/Downstream Integration Support
The platform supports factory automation workflows, including:
· Barcode scanning (manual or automatic)
· Ink-dot and laser marking for traceability
· Interfaces for robotic loading and conveyor link-up
This makes the system compatible with smart manufacturing and production line automation.
3. Inspection Performance Specifications
Key performance metrics reflect the system’s capability to resolve fine details and deliver repeatable quality control:
· Maximum Inspection Range: up to 300 × 300 mm substrate size
· Measurement Precision: up to ±1 µm
· Defect Detection Accuracy: as fine as 5 × 5 µm detection sensitivity
· Compatible Loading Methods: ceramic substrates, wafer rings and related formats
These specifications position the system for demanding inspection tasks where micro-scale defect detection is essential to maintain production yield and reliability.
Features：
1. Patented optical system accurately inspects ceramics, metals, and polymers with high reliability.
2. Custom-engineered ±1µm precision marble platform with linear servo motors supports automatic/manual barcode scanning, ink-dot and laser marking, multi-hole ceramic platform, robotic loading, and full upstream/downstream equipment integration
3. Smart detection software: DXF one-click programming, AI + traditional dual-mode detection, automatic defect analysis
Application Fields
Semiconductor, new energy and other industries
Testing Products
Green ceramic tapes, thin-film circuits, thick-film ceramic substrates, resistor substrates, and other ceramic substrate derivatives.
Industrial Role
From an engineering and quality assurance perspective, the system fulfills key industry needs for automated inspection: it replaces manual visual inspection with a non-contact, repeatable, and scalable solution, improving both throughput and defect traceability. Automated optical inspection has become a standard method for detecting surface and pattern anomalies in high-volume manufacturing because it reduces human variability and integrates into digital quality management systems.
In contexts involving ceramic substrates, this system extends traditional AOI concepts to materials that present unique optical challenges — such as diffuse reflectivity and variable texture — by combining customized optics, precision mechanics, and AI-enhanced detection.
