Unlike a conventional parallel test handler that focuses on device loading, unloading, and sorting, the BNx-3000 is a dedicated burn-in testing system designed to support multi-site parallel test handling during long-duration reliability testing.
By enabling simultaneous control and monitoring of multiple devices under test (DUTs), the BNx-3000 allows users to perform parallel burn-in testing across multiple channels within a single system. This approach significantly improves test throughput, reduces overall test cycle time, and lowers the cost per device for high-volume reliability screening.
The system supports multi-site parallel operation in tri-temperature environments, making it suitable for applications that require extended stress testing at high, low, or ambient temperatures while maintaining consistent test conditions across all DUTs.
1. Precise independent control of product power ON/OFF, input and output signal monitoring; supports series/parallel control of multiple products to reduce costs.
2. Robust temperature control system adjusts environmental and product case temperatures; cooling methods include air, gas, or liquid depending on product power.
3 Energy-saving mode cuts power bills by recycling test energy
4. Smart monitoring tracks all test data, auto-flags bad units, and sorts them via MES-connected handlers
Typical Applications of Multi-site Parallel Testing Handler
· High-volume semiconductor reliability screening
· Automotive electronics burn-in and qualification testing
· Power devices and discrete components
· Long-duration stress testing prior to final test or shipment
· Multi-device reliability verification under tri-temperature conditions
Is BNx-3000 a Parallel Test Handler?
No. The BNx-3000 is not a parallel test handler in the traditional sense.
A conventional parallel test handler is primarily designed for automated device loading, socketing, and sorting during final electrical testing with ATE systems. In contrast, the BNx-3000 is a burn-in testing system that focuses on parallel reliability stress testing over extended periods.
However, BNx-3000 supports parallel test handling at the system level by enabling multiple DUTs to be tested simultaneously under controlled temperature conditions, achieving high throughput during the burn-in stage.
