• Seamlessly integrates precision pick-and-place, multi-dimensional inspection, intelligent sorting, and automated packaging.
• Works with testers for electrical parametric testing and Automated Visual Inspection (AVI) for dimensions and defects.
• Features a mechanical alignment platform supporting dual-accuracy specs of ±30μm and ±50μm.
• Equipped with dual nozzles supporting auto-changeover, easily adapting to multi-size dies from 1mm×1mm to 24mm×24mm.
DMH-3000 Desktop Tri-Temperature IC Test Handler
The DMH-3000 is a compact desktop tri-temperature IC test handler developed for semiconductor engineering validation and flexible small-batch testing. It combines precision device handling, electrical test integration and intelligent binning across -60°C to +180°C, supporting devices from 1 × 1 mm to 24 × 24 mm and up to eight test sites. Explore our complete range of [tri-temperature test handler systems](/tri-temperature-test-product/) for additional engineering and production configurations.
Compact Tri-Temperature Testing for Engineering Lots
Manual hot and cold testing can require repeated device transfer, separate thermal equipment and operator-dependent sorting. The DMH-3000 Desktop Tri-Temperature IC Test Handler brings device positioning, temperature conditioning, electrical test contact and result-based sorting into a compact engineering platform. It helps IC design houses, semiconductor laboratories, IDMs and OSAT teams create repeatable test flows while avoiding the floor-space and capacity commitment of a high-volume production handler.
The wide thermal range supports cold, ambient and hot electrical characterization for product development, NPI, qualification support, failure analysis and controlled low-volume processing. Up to eight test sites allow the system to balance parallelism with flexible engineering operation.
Applicable Industries
◆ IC Design & NPI Validation
◆ OSAT Backend Testing
◆ Optoelectronics & Photonics
◆ Automotive & Industrial Quality Control
◆ Turnkey Programming & Test Hubs
Capabilities & Features
| Item | Specification |
|---|
| Product Name | Multifunctional Engineering Sorter |
| Model | DMH-3000 |
| X/Y Positioning Accuracy | ±30 μm / ±50 μm (Calibration Sample) |
| Rotation Accuracy | ±0.1° (Calibration Sample) |
| Rotation Range | 0–360° |
| UPH (Units Per Hour) | 1,200 pcs/h (Standard Sample) |
| Supported Chip Size | 1 mm × 1 mm to 24 mm × 24 mm |
| Loading / Unloading | Single Tray |
| Test Sites | Up to 8 Sites |
| Main Unit Dimensions | 800 × 600 × 800 mm (excluding loading/unloading module) |
| Operating Air Pressure | 0.4–0.6 MPa |
| Equipment Weight | 100 kg |
| Power Supply | 220 V, 50/60 Hz, 2.5 kVA |
| Operating Environment | 20 ± 3°C / 40%–60% RH |
Why Source Your Desktop Tri-Temperature IC Test Handler from Top Leading?
Top Leading has expanded its manufacturing facility to approximately 10,000 m², shipped more than 1,000 equipment units, and built an R&D team with more than 15 years of smart-manufacturing and semiconductor-equipment experience. The company holds more than 95 patents and software copyrights, operates under an ISO quality management system.
Beyond the DMH-3000 Desktop Tri-Temperature IC Test Handler, our equipment portfolio includes die bonders, automated optical inspection systems, semiconductor test handlers, KGD and die sorting platforms, tri-temperature systems and precision press-fit equipment. This broader portfolio gives customers one engineering partner for device handling, inspection, electrical testing, thermal testing, sorting and automation integration.
Need a Tri-Temperature Test Handler for Your IC Testing?
Choose a Tri-Temperature Test Handler configured for your device type, temperature range, test sites and throughput requirements. Contact us for technical specifications, configuration options and a customized quotation for your semiconductor testing application.
